Asylum Research

Cypher S

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Latest News

Atomic Force Microscopes from Asylum Research Guide the Development of Thin Film Deposition and Etch Processes

Oxford Instruments Asylum Research Announces New Sample Heating Capability for its Value-Priced MFP-3D Origin Atomic Force Microscope

New GetStarted™ Feature on Asylum Research AFMs Makes Imaging Easier and More Productive While Maintaining All the Benefits of Tapping Mode

Oxford Instruments Asylum Research in Conjunction with the MRS OnDemand® Webinar Series Presents: “Beyond Topography: New Advances in AFM Characterization of Polymers” May 28, 2015

New Application Note Describes Nanomechanical Measurements on Diverse Materials Using the Asylum Research NanomechPro Toolkit

Oxford Instruments Asylum Research Presents “Piezoresponse Force Microscopy: From Theory to Advanced Applications”
Two-part Webinar Series May 4 and May 6, 2015

Oxford Instruments Asylum Research Releases New Application Note: “AFM Applications in Polymer Science and Engineering”

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New Application Notes, Datasheets, and Articles

The NanomechPro™ Toolkit - Nanomechanical AFM Techniques for Diverse Materials

AFM Applications in Polymer Science and Engineering

AM-FM Viscoelastic Mapping Mode

blueDrive™ Photothermal Exicitation

Contact Resonance Viscoelastic Mapping Mode

GetReal™ Automated Probe Calibration

Graphene and other low-dimensional materials


Workshops, Talks and Tutorials

Congress of the Hungarian Biophysical Society & Workshop, Technical Poster: "Soft, Squish, and Sticky: Practical Considerations for Biomechanical AFM Measurements", Semmelweis, Hungary, Aug. 25-28

September 3-5, ChinaNano 2015, Beijing, China

Non-Contact AFM, Technical Poster: "Quantifying the effects of cantilever modes shapes on studies of the liquid-solid interface", Cassis, France, Sept. 7-11

For additional details, see our events page



Oxford Instruments Asylum Research • Halifax Rd • High Wycombe • Buckinghamshire • HP12 3SE • UK
Tel: +44 (0)1494 479369 • Fax: +44 (0)1296 301053 •


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