home
products
applications
news
events
reference
gallery
support
about
contact

Galleries | Materials | Electronics | Conductive AFM (ORCA™)

 

Europium-doped ZnO

Topography and current images of a Europium-doped ZnO sample with pinholes
at a bias of 1.5 volts. I-V curves were taken at three locations on the image.

 

 


Asylum Research UK Ltd • Oxford Centre for Innovation • Mill Street • Oxford • OX2 0JX
Voice +44 (0)1865 812075 • Fax +44 (0)1296 301053 • sales@AsylumResearch.co.uk