| Model |
Type |
Price |
| 900.237 |
Asylum Research CalibratAR 3D Calibration Reference for X, Y and Z calibration of the scanning mechanism. 10mmx10mm Si die, 0.5mm thick containing two pitch and step-height gratings. Mounted on 15mm diameter steel puck. |
$500 |
| 900.238 |
Asylum Research CalibratAR 3D Calibration Reference for X, Y and Z calibration of the scanning mechanism. 10mmx10mm Si die, 0.5mm thick containing two pitch and step-height gratings. Mounted on 3" x1" glass slide. |
$500 |
| 900.239 |
Asylum Research CalibratAR 3D Calibration Reference for X, Y and Z calibration of the scanning mechanism. 10mmx10mm Si die, 0.5mm thick containing two pitch and step-height gratings. Unmounted. |
$450 |
| 2D100 |
Nanosensors Calibration Standard for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 100nm pitch. |
$1,600 |
| 2D200 |
Nanosensors Calibration Standard for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 200nm pitch. |
$1,000 |
| 2D300 |
Nanosensors Calibration Standard for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 300nm pitch. |
$1,000 |
| ALIGN 10 |
Nanosensors Alignment Chip suitable for all, diamond coated, high aspect ratio and supersharp silicon sensors. |
$500 |
| FLAT |
Nanosensors Flatness Standard for analysis and correction of the scanner bow, smooth plane with a maximum peak to valley distance of 10nm on a 100x100µm2 area. |
$800 |
| H8 |
Nanosensors Height Standard for very precise z-calibration, nominal step height 8nm. |
$1,600 |
| Model |
Type |
Price |
| 900.241 |
The AR-PPLN Test Sample is a convenient and reliable sample for practice, setup, and verification for a wide variety of Piezoresponse Force Microscopy (PFM) techniques. Mounted on a 15mm diameter steel puck. |
$350 |
| 900.242 |
The AR-PPLN Test Sample is a convenient and reliable sample for practice, setup, and verification for a wide variety of Piezoresponse Force Microscopy (PFM) techniques. Mounted on a 3" x 1" microscope slide. |
$350 |
| 900.243 |
The AR-PPLN Test Sample is a convenient and reliable sample for practice, setup, and verification for a wide variety of Piezoresponse Force Microscopy (PFM) techniques. Unmounted. |
$300 |
| SEBS |
KRATONTM G-1652 thermoplastic rubber triblock copolymer with polystyrene end blocks and a rubbery poly(ethylene-butylene) mid block. with a monolayer to two layers thick (between 28nm and 50nm). Samples are all spin cast and annealed. |
$200 |
| Application Kits |
Specialized kits that contain a variety of items (such as samples and cantilevers) for application-specific imaging such as phase imaging, spring constant calibration and DNA imaging and force measurements. |
| Gold Slides |
A variety of continuously coated or patterned gold substrates including glass or mica microscope slides |
